Metrohm launches new spectrometer

Herisau - Metrohm is launching a new spectrometer for x-ray fluorescence applications in the form of the 2060 XRF Process Analyzer. The new device facilitates non-destructive analysis for liquid process control activities.

Metrohm, the process analytics specialist based in the St.GallenBodenseeArea, has launched a new x-ray fluorescence (XRF) spectrometer on the market in the form of the 2060 XRF Process Analyzer. According to a press release, the new analysis system is capable of analyzing a wide range of elements from magnesium to uranium in liquid samples. The advantage of the non-destructive analysis used in this case is that no reagents are required, which helps both to avoid contamination of the analysis device and reduce waste.

Using modern XRF technology, samples can be identified and quantified. The 2060 XRF Process Analyzer works in real time and enables continuous data collection. With the company’s proprietary IMPACT and Vanta IMPACT software packages, the new analyzer can proactively monitor critical processes thanks to extensive programming options. In this way, users are able to make informed decisions in real time.

The 2060 XRF Process Analyzer is compatible with other Metrohm products and can be used in conjunction with the control unit of the Vanta system. ce/eb